diffraction

Plane diffraction grating, logarithmic amplifier and stable constant-current source are used in the system, thus the performance of the instrument is enhanced significantly and the cost is reduced.

系统采用了平面衍射光栅、专用阵列探测器、对数放大器以及高稳定恒流源，有效地提高了仪器的整体性能，同时降低了生化分析仪的成本。

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Diffraction efficiency of sinusoidal grating and lamellar one with shallow groove

正弦形和矩形浅槽光栅的衍射效率

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Electron Back Scatter Diffraction ( EBSD) and Electron Channel Contract ( ECC) techniques are used for the structure observation.

在扫描电镜上利用背散射电子衍射（EBSD）和ECC新分析技术研究了等通道转角挤压对微观组织的影响。

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The residual stress of aluminum film on plastics film substrate is studied with X ray diffraction.

利用X射线衍射研究了在塑料表面真空生成的铝膜残余应力。

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The uncertainty principle can account for diffraction.

测不准原理可以说明衍射.

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Endeavour is designed for the solution of crystal structures from powder diffraction data.

专业的化学工业软件,用来设计粉末衍射的晶体结构.

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With the application of core analysis techniques, such as thin section identification, x ray diffraction and SEM, reservoir characteristics, such as lithology, mineral components and pore structure, are studied.

为此，应用薄片鉴定、X射线衍射、扫描电镜等岩心分析技术，根据现场岩心研究了储层岩石的岩性、矿物成分、孔隙结构等储层特征。

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Diffraction Characteristics of HUD Holographic Combiner Mirror, Mirror, on the Wall

平显全息组合镜的衍射特性研究

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A fundamental limit is imposed by the size of the diffraction disk of the telescope.

一个基本的极限是由望远镜衍射园面的大小决定的.

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Describes several measuring methods of flatness of large plane. Analyzes the characteristics and error of these methods including indirect measuring method, dual laser beams scanning method, laser criterion line scanning method, diffraction plane criterion method and level surface method.

叙述了几种大平面平面度的测量方法，分析了间接测量法、激光双光束扫描法、激光准直扫射法、衍射平面基准法、液面法等几种方法的特点及其测量误差。

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Their structures and chemical properties were studied by X ray diffraction, TEM and charge discharge analysis.

采用X-射线衍射法，透射电镜和充放电测量研究了它们的结构和性质。

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The wear properties, surface appearance and anti-corrosion properties for these composite coatings were studied by X-ray diffraction, XPS, SEM.

利用摩擦磨损实验机、电化学综合测试仪、X射线光电子能谱（XPS）和扫描电子显微镜等分析复合镀层的摩擦磨损性能、耐腐蚀性能、表面形貌特性。

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Under the condition that the propagation constant k> 0, the paraxial expression for ultrashort pulsed Gaussian beams with constant diffraction length in a dispersive medium is derived eliminating the spatial singularity.

提出存在于光束传输中的隐含条件k＞0式，得到等衍射脉冲高斯光束在色散介质中的无非光束行为的傍轴传输方程。

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The X ray Diffraction Analysis of the Multiplex Doping sintering Layer on the Surface of Copper

铜表面多元渗-烧结层的X射线衍射分析

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The experiment proves that simultaneous equations method applies to quantitative X-ray diffraction phase analysis of geologic samples.

本实验证明联立方程法能应用于地质样品的X射线衍射的定量相分析。

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Through X " diffraction analysis of the protection film , the theory of gas protection certificated. "

通过对 保护膜 的X衍射分析, 验证气体防燃机理.

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Catalyst characterization was carried out by X ray diffraction ( XRD), temperature programmed desorption ( TPD), temperature programmed reduction ( TPR), and low temperature N 2 adsorption ( BET method) technologies.

用X-射线衍射（XRD）、程序升温脱附（TPD）、程序升温还原（TPR）、低温氮吸附（BET）等方法对催化剂进行了表征。

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A holographic lens is developed and its reconstruction diffraction efficiency is as high as 63 %.

实验研制了一个全息透镜,其再现衍射效率达到63%.

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X-ray diffraction studies on limestone after shock loading

冲击加载石灰岩形变的X射线分析

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The diffraction efficiencies are given and compared with scalar results.

给出了计算结果,并与标量近似计算结果进行比较.

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Structural Analysis of Nd_2Fe_ ( 14) B Crystal Application in Quantitative Phase Analysis of X ray Diffraction

Nd2Fe（14）B晶体结构分析&在X射线定量相分析中的应用

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A full vector diffraction theory for optical disk system is described.

本文以完整的矢量衍射理论分析了光盘光学系统.

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Diffraction efficiencies of the photopolymer at four wavelengths are no less than % and 8 % in maximum.

实验结果表明,该材料在四种波长的激光照射下,其最大衍射效率均不低于%,最大8豫.

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The obvious question becomes: is this diffraction limited or not?

现在问题变成: 这个是不是衍射极限的作用?

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X ray double crystal diffraction in application to microwave semiconductor device

X射线双晶衍射在微波半导体器件中的应用

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An in Situ X Ray Diffraction Apparatus for Determination Structure Change of Specimen under Different pressures

用于X射线衍射测量的样品加压原位装置

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Fresnel diffraction pattern numerical Fresnel diffraction pattern numerical simulation!

菲涅耳衍射图样数值模拟!

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Phase extension result from the diffraction data corrected directly by the method in Ref. 12.

直接利用文献[12]的方法校正衍射数据并对解卷像作相位外推的结果.

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Electron back scattered diffraction ( EBSD ) was used to measure the grain size of HPT treated samples.

使用电子背散射衍射技术测量了处理后试样品粒尺寸沿径向的分布.

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The high frame rate ( HFR) ultrasonic imaging system, which is developed with limited diffraction beams, constructs images at a high frame rate. However the rectangular imaging area, to some extent, restricts the far field imaging information.

基于有限衍射波束的高帧率（high frame rate，HFR）成像系统能实现快速成像，但成像区域为矩形，使得远区成像的信息量受到一定的限制；

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